JSM-IT200 InTouchScope™ Scanning Electron Microscope from JEOL

Inquire

from
JEOL for
JSM-IT200 InTouchScope™ Scanning Electron Microscope

Description

JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScopeTM, with significantly higher throughput. Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, SMILE VIEW(TM) Lab for seamless report generation of observation and/or analysis results, etc., provide fast analysis with integrated transition from OM to SEM. Fast observation, analysis and report generation! JEOL InTouchScope™ series, the high performance analytical tool with major three functions.